Belgium – Scanning electron microscopes – Supply, installation and commissioning of a scanning electron microscope with an EDS microanalysis system.
Purchase of a scanning electron microscopy (SEM) system equipped with a Field Emission Gun source as well as an EDS (Energy-Dispersive X-ray Spectrometry) detector enabling morphological and compo
Opportunity description
Purchase of a scanning electron microscopy (SEM) system equipped with a Field Emission Gun source as well as an EDS (Energy-Dispersive X-ray Spectrometry) detector enabling morphological and compositional imaging of mineralogical and geological samples. This microscope will also be equipped with a secondary electron (secondary electrons—SE) detector and a backscattered electron (backscattered electrons—BSE) detector, as well as software capable of easily providing good-resolution EDS compositional mappings. The microscope chamber must be large enough to accommodate geological samples exceeding 15 cm in diameter and 5 cm in height, and a system for coating the samples with graphite will be provided. These instruments will be integrated into the analytical equipment of the ULiège Mineralogy Laboratory and will make it possible to meet the specific needs of a broad scientific community, notably including members of the Department of Geology and the European Centre for Archaeometry. Procedure: open. Review the original TED notice for the complete requirement, lots, amendments and attachments.
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