France – Scanning electron microscopes – Supply of a nuclearized dual electron and ion beam microscope (SEM-FIB) and its accessories (in-situ nanoindenter and metal coating and carbon deposition system) for the Materials Physics Group.
Supply of a nuclearized dual electron and ion beam microscope (SEM-FIB) and its accessories (in-situ nanoindenter and metal coating and carbon deposition system) for the Materials Physics Group, University of R
Opportunity description
Supply of a nuclearized dual electron and ion beam microscope (SEM-FIB) and its accessories (in-situ nanoindenter and metal coating and carbon deposition system) for the Materials Physics Group, University of Rouen Normandy Lot 1 - Supply of a “dual beam” microscope, that is, a scanning electron microscope (SEM) equipped with a focused ion beam column. Lot 2 - Supply of an in-situ nanoindenter. Instrumented indentation platform that can be installed in a scanning electron microscope to perform in-situ micro- and nanomechanical tests, in order to view the tests live with the microscope. Lot 3 - Supply of a metal coating and carbon deposition system using carbon braid, operating under secondary vacuum. Procedure: open. Estimated value: 0 EUR. Review the original TED notice for the complete requirement, lots, amendments and attachments.
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