Germany – Miscellaneous special-purpose machinery – Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W
Secondary ion mass spectrometer (SIMS) 1 pc. The objective is to procure a highly sensitive SIMS instrument for depth‑profiled chemical analysis of semiconductor materials and structures, offering high depth resolution and high mass resolvi
Opportunity description
Secondary ion mass spectrometer (SIMS) 1 pc. The objective is to procure a highly sensitive SIMS instrument for depth‑profiled chemical analysis of semiconductor materials and structures, offering high depth resolution and high mass resolving power. The system shall enable precise dopant and impurity profiling, as well as accurate determination of layer thickness and homogeneity, with a focus on characterizing advanced III‑V and diamond‑based device structures and epitaxial layers, including 150 mm substrates, to support process development, quality control and optimization at Fraunhofer IAF. Procedure: open. Review the original TED notice for the complete requirement, lots, amendments and attachments.
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